Double Beam Laser Interometer


As innovation leader for electrical thin film testing aixACCT Systems has extended the well approved double beam technique to the first commercially available Double Beam Laser Interferometer system for up to 8 inch wafer characterization.


The Double Beam Laser Interferometer (aixDBLI) for the measurement of d33 offers a proven accuracy (x-cut quartz) up to 0.2 pm/V. The main feature of the system is the ultra fast acquisition time of a few seconds for a single measurement. Based on a new data acquisition algorithm, the measurement speed is enhanced by a factor of 100. This enables for the first time the comparison of electrical and mechanical data for thin films recorded at the same excitation frequency. Due to the the differential measurement principle the influence of sample bending is eliminated, which is the major obstacle using atomic force microscopes (AFM) for these types of measurements.


Measurements

  • Electromechanical large signal strain and polarization measurements.
  • Piezoelectric small signal coefficient and dielectric constant vs. dc bias voltage measurements. From these values the coupling coefficient can be derived by using the additional aixPlorer software tool if the stiffness value is known.
  • Fatigue of electric and electromechanical properties.

The unique properties of the aixDBLI system make it suitable for piezoelectric and electrical reliability testing of MEMS (micro electro mechanical systems) devices on 6" wafers. The excellent resolution of this system with an repeatability accuracy better than 2 % distinguish this system for mass production qualification. The whole set-up consists of optical components in a vibration damped chamber, the TF Analyzer 2000 and some additional analog circuitry.


For more info visit www.aixacct.de


Analyzers
Alpha-A Series
HVB300
HVB1000
HVB4000
POTGAL15V10A
POTGAL30V2A
Beta Series
Alpha Series
Temperature Control Systems
Quatro Cryosystem
Novocool
Novotherm
Novotherm-HT
Industrial Temperature Controller
Purge Gas Option
Preparation Chamber
Turnkey systems
BDS Turnkey Dielectric / Impedance Spectrometers without Temperature Control
Concept Turnkey Dielectric, Conductivity and Impedance Spectrometers with Temperature Control
RF Extension


MEMS Products
Double Beam Laser Interferometer (aixDBLI)
Sensor & Actuator Products
Ceramic Multilayer Actuator test bench
Piezoelectric Evaluation System (aixPES)
Thin Film & Memory Products
TF 2000 E
TF 1000
Easy Check
FeRAM Cell Tester


ProboStat


Electrochemical
Line 7000
7030 - High Impedance Adapter
7060 - Potentiostat / Galvanostat ± 30 V - ± 10 A
7050 - Potentiostat / Galvanostat ± 45 V - ± 4 A
7200 - Frequency Response Analyser
7805 - Hi-Speed arbitrary waveform generator and digitaliser
Line 2000
2049 - Potentiostat / Galvanostat ± 22 V - ± 1,2A
2053 - Research Potentiostat / Galvanostat ± 50 V - ± 1,2 A
2059 - Low-current Potentiostat / Galvanostat ± 10 V - ± 10 mA
7800 - 16-Bit Interface and Function Generator for 2000 series


Cell Products
HTSH-1200
FCSH-1000
FCSH-V3
AE Products
520
7260


Precision Measurement Instruments
Integrated Measurement Solutions
Laser Triangulation Systems
Fiber Optic Measurement Systems
Capacitance Measurement Systems
Precision Signal Source/Function Generator
Calibration and Fixturing