The AWgage‑150 is a non-contact sheet resistance and thin‑film thickness measurement tool, designed for wafers from 2″ to 6″. It accurately measures sheet resistance from 1 mΩ/□ up to 19,990 Ω/□ and deduces film thickness from known resistivity values. Featuring a touchscreen interface, automated wafer handling, high repeatability, and a compact, energy-efficient design, it’s ideal for semiconductor metrology applications.
Rapid Thermal Process

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Plasma Asher Strip / Descum
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