Metal Film Metrology

Metal Film Metrology

The AWgage‑150 is a non-contact sheet resistance and thin‑film thickness measurement tool, designed for wafers from 2″ to 6″. It accurately measures sheet resistance from 1 mΩ/□ up to 19,990 Ω/□ and deduces film thickness from known resistivity values. Featuring a...
Sputter Deposition

Sputter Deposition

Allwin21 Corp. has been focusing on providing solutions and enhancements to Perkin-Elmer 4400, Perkin-Elmer 4410, Perkin-Elmer 4450 and Perkin-Elmer 4480 used sputter deposition semiconductor process equipment. This OEM semiconductor equipment have been used in...
Plasma Etch/RIE

Plasma Etch/RIE

Allwin21 Corp. has been focusing on providing solutions and enhancements to plasma Etch RIE semiconductor process equipment. These OEM Etch RIE semiconductor equipment have been used in productions and R&D since 1990′s. They have been Process-Proven. Allwin21...